Automation solutions & test services to break the bottleneck of integrated photonics R&D and production.
100 times faster in test and data analysis.
A fully automated and comprehensive photonics test solution
From single die to the largest wafer
E-PhAuto: a turn key solution for automated integrated photonics tests
- Die-level and wafer-scale probe stations (up to 300-mm wafers)
- Edge and surface coupling
- Ultra-fast navigation with nanoscale optical alignment
- Fully automated electronic-photonic test for high-throughput operation
- User-friendly operating system for a quick boost
- Integration with advanced electrical and optical instruments
- Seamless integration with an existing data platform or EVHA’s E-Tensor
E-Tensor: an intelligent platform for test automation, data management and analysis
- Unified software system for various scales ranging from single dies to 300-mm wafers
- Easy definition of test sequence enabling complex tasks
- Management of mega data
- Assistance in information extraction and presentation
- Efficient data access and sharing within a team and through the production line
Chip Testing Service: an advanced test service with 10+ years of R&D experience in silicon photonics, lasers, and optical communications
- State-of-art lab facilities for silicon photonics and semiconductor optoelectronics
- Single-die, multi-die, and wafer scale (up to 12”)
- Comprehensive electro-optic, RF, and thermo-optic tests
- Design for test solutions
Silicon Photonics will never be the same